All samples are analysed for asbestos using a JEOL JSM-6480LV SEM with an Oxford INCA X-sight EDXA (Energy Dispersive X-Ray Analysis system). All samples are analysed by Microtech Sciences Ltd (UKAS 2765) accredited to ISO17025.
The JSM-6480LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode, allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface.
Scanning Electron Microscopy (SEM) is a powerful method of imaging asbestos fibres. SEM analysis can be used to examine surface features, textures and particles that are too small to see with standard optical microscopes.